A conservative model for small electric field sources in analytical RF exposure assessments

dc.contributor.authorSengupta, Sayani
dc.contributor.authorSilberman, Samuel
dc.contributor.authorRouse, Chris D.
dc.date.accessioned2026-06-10T13:43:01Z
dc.date.issued2025-08-19
dc.description.abstractThis paper proposes a modelling approach for small electric-field (E-field) sources, e.g., capacitive power transmitters, that is conservative from a radiofrequency (RF) exposure standpoint. The conservatism of the proposed model is demonstrated via simulation, and an analytical approach for assessing RF exposure in a homogeneous flat phantom is presented. Results include maximum drive current levels for this phantom as a function of source dimension and separation distance. Future research will explore field enhancement effects due to the shape and orientation of the phantom as well as tissue heterogeneity. In addition to improving our understanding of the coupling effects between small E-field sources and human tissue, this research could lead to the development of analytical exemption levels to reduce the compliance burden of low energy sources, such as small capacitive chargers and active sensors.
dc.description.copyright2025 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.identifier.urihttps://unbscholar.lib.unb.ca/handle/1882/38652
dc.language.isoen
dc.publisherIEEE
dc.relationNatural Sciences and Engineering Research Council of Canada (NSERC)
dc.relationMitacs in collaboration with Solace Power, Inc.
dc.relation.hasversion10.1109/ANTEM64578.2025.11114255
dc.rightshttp://purl.org/coar/access_right/c_abf2
dc.subject.disciplineElectrical and Computer Engineering
dc.titleA conservative model for small electric field sources in analytical RF exposure assessments
dc.typeconference paper
oaire.citation.conferenceDate2025-07
oaire.citation.conferencePlaceSt. John's, NL, Canada
oaire.citation.title2025 IEEE 20th International Symposium on Antenna Technology and Applied Electromagnetics (ANTEM)
oaire.versionhttp://purl.org/coar/version/c_ab4af688f83e57aa

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