VLSI circuit testing

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dc.contributor.advisorM., Luke
dc.contributor.authorClaxton, Kent Charles
dc.date.accessioned2023-06-07T19:01:59Z
dc.date.available2023-06-07T19:01:59Z
dc.date.issued1989
dc.description.copyrightNot available for use outside of the University of New Brunswick
dc.description.noteClaxton, Kent Charles (1989). VLSI circuit testing . (Engineering Senior Report no. EE-141 1989). Fredericton : University of New Brunswick, Dept. of Electrical and Computer Engineering EE-141 1989 1882/12778
dc.format.mediumelectronic
dc.identifier.urihttps://unbscholar.lib.unb.ca/handle/1882/32489
dc.language.isoen_CA
dc.publisherUniversity of New Brunswick
dc.rightshttp://purl.org/coar/access_right/c_16ec
dc.subject.disciplineEngineering
dc.titleVLSI circuit testing
dc.typesenior report
thesis.degree.disciplineEngineering
thesis.degree.fullnameBachelor of Science in Engineering
thesis.degree.grantorUniversity of New Brunswick
thesis.degree.levelundergraduate
thesis.degree.nameBachelor of Science in Engineering

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